By A Mystery Man Writer
Defect Rate, Reliability, System Size, and Limits on Growth
A voting-based ensemble feature network for semiconductor wafer
Process Capability Indices
Defect area statistics of chart of different types of defect
Reliability Calculations for an Array of Electronic Components
Value-Added Assessment of Inpatient Casemix File Proces
Defects-per-unit control chart for assembled products based on
Attribute Charts
Distribution chart of defect number and defect rate among devices
Distribution chart of defect number and defect rate among devices